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PDF) Test pattern generation based on arithmetic operations
PDF) Pseudorandom, Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata
NiDS2022 (Novel & Intelligent Digital Systems) - ATHENS
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
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PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
PDF) Accumulator-Based Weighted Pattern Generation.
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
PDF) Modeling and Simulation of Efficient March Algorithm for Memory Testing
PDF) Symmetry Measure for Memory Test and Its Application in BIST Optimization
PDF) A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
PDF) Efficient Test Compaction for Pseudo-Random Testing
PDF) Multimode scan: Test per clock BIST for IP cores
PDF) Memory testing with a RISC microcontroller
PDF) Detection of Delay Faults in Memory Address Decoders
PDF) On the Generation of Functional Test Programs for the Cache Replacement Logic
ERCIM News 96 by Peter Kunz - Issuu
PDF) Moduli Set Selection and Cost Estimation for RNS-Based FIR Filter and Filter Bank Design
Education and Information Technologies | Home
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Dimitris Magos's research works | University of West Attica, Athens (TEIATH) and other places
Steffen Tarnick's research works | Universität Potsdam, Potsdam and other places
PDF) Concurrent Self-Test with Partially Specified Patterns For Low Test Latency and Overhead
PDF) On the generation of pseudo-deterministic two-patterns test sequence with LFSRs.
